Your search returned
10
records. Click on the hyperlinks to view further details of Titles..
Magazine Name
:
Ieee Design And Test Of Computers
Year :
1998
Volume number :
15
Issue:
04
Guest Editors'S Introduction: Online Vlsi Testing.
(Article)
Subject
:
Author:
Michael Nicolaidis Ramesh Karri
page:
12 -
16
Online Bist For Embedded Systems.
(Article)
Subject
:
Author:
Hussain Al-Asaad Brian T Murray
page:
17 -
24
Efficient Self-Recovering Asic Design.
(Article)
Subject
:
Author:
Samuel N Hamilton Alex Orailoglu
page:
25 -
35
Synthesizing Fast, Online-Testable Control Units.
(Article)
Subject
:
Author:
Sybille Hellebrand Andre Hertwig
page:
36 -
41
Concurrentchecking Of Clock Signal Correctness.
(Article)
Subject
:
Author:
Cacilia Metra Michele Favalli
page:
42 -
48
Online Currenttesting.
(Article)
Subject
:
Author:
Jien-Chung Lo
page:
49 -
56
On-Chip Iddq Testing In The Ae11 Fail-Stop Controller.
(Article)
Subject
:
Author:
Thomas Lindenkreuz Eberhard Bohl
page:
57 -
65
Fault Analysis For Networks With Concurrent Error Detection.
(Article)
Subject
:
Author:
Cristiana Balchini Fabio Salice
page:
66 -
74
The Third Millennium'Stest Dilemma
(Article)
Subject
:
Author:
Bill Bottoms
page:
7 -
11
Using Laser Defect Avoidance To Build Large-Area Fpgas.
(Article)
Subject
:
Author:
Glenn H Chpman Benoit Dufort
page:
75 -
81
